Pintail expands adaptive test solutions

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DALLAS, USA: Supplier of Adaptive Test software for semiconductor manufacturing, Pintail Technologies has announced that they will incorporate advanced outlier detection algorithms developed by Avago Technologies into Pintail's commercial software offerings.

Pintail's SwifTest is a new class of statistical test software that can increase the quality and reliability of tested components by performing dynamic outlier detection and rejection during on-line production.

"Pintail wants to thank Pete O'Neill of Avago for selecting SwifTest as the most efficient vehicle to deliver his statistical test concepts into volume production," stated Taylor Scanlon, president and chief executive officer of Pintail. "Pete is a recognized leader in this field and has been instrumental in showing us how to expand SwifTest's capabilities to include a whole new generation of adaptive test techniques."

Avago worked closely with Pintail over the past 12 months as Pintail re-architected SwifTest to accommodate more sophisticated and general purpose sets of data models and program interfaces. Pintail plans to include Avago algorithms in its future SwifTest product offerings.

Users will also be able to add their own proprietary algorithms to SwifTest for performing on-line test time reduction or quality improvement.

There are over 400 copies of SwifTest in worldwide production today running on a variety of leading testers including Verigy's 93K, Teradyne's FLEX, J750 and Image-based testers and many other ATEs. Avago plans to use SwifTest in its production flow.




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